Design for Testability

Scan insertion, ATPG strategies, boundary scan, and test pattern generation for manufacturing readiness.

Scan Chain Architecture

Scan insertion strategies, multiplexer design, clock gating considerations, and chain optimization.

ATPG & Pattern Generation

Automatic test pattern generation, fault simulation, coverage analysis, and test compression techniques.

Test Methodology & Sign-off

Boundary scan basics, BIST fundamentals, debug strategies, and design-for-debug practices.

What we provide

  • Scan chain insertion and DFT architecture design for maximum test coverage.
  • ATPG strategy and test pattern development for manufacturing tests.
  • Built-in self-test and boundary scan fundamentals.
  • How to structure designs for manufacturability, debug, and production readiness.